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Stochastic analysis of a two-unit parallel system with partial and catastrophic failures and preventive maintenanceGOEL, L. R; GUPTA, P.Microelectronics and reliability. 1984, Vol 24, Num 5, pp 881-883, issn 0026-2714Article

Stochastic scheduling on a single machine subject to multiple breakdowns according to different probabilitiesWEI LI; JINHUA CAO.Operations research letters. 1995, Vol 18, Num 2, pp 81-91, issn 0167-6377Article

Probability of error in combinational logic systems containing soft failsREDINBO, G. R; WANG, G. X.IEE proceedings. Part E. Computers and digital techniques. 1983, Vol 130, Num 4, pp 125-137, issn 0143-7062Article

Sources de pannes des pompes à chaleur (sur l'air)Promoclim A. 1982, Vol 13, Num 5, issn 0249-6526, 7Article

Dependable computing: from concepts to design diversityAVIZIENIS, A; LAPRIE, J.-C.Proceedings of the IEEE. 1986, Vol 74, Num 5, pp 629-638, issn 0018-9219Article

A dependent multiple failure mode modelling procedureBOROWIAK, D.Communications in statistics. Theory and methods. 1985, Vol 14, Num 8, pp 1837-1847, issn 0361-0926Article

The Bhopal disaster: Understanding the impact of unreliable machinery : PROCESS/PLANT OPTIMIZATIONBLOCH, K; JUNG, B.Hydrocarbon processing (International ed.). 2012, Vol 91, Num 6, pp 73-76, issn 0018-8190, 4 p.Article

A NEW METHOD TO DETERMINE THE FAILURE FREQUENCY OF A COMPLEX SYSTEM.CHANAN SINGH; BILLINTON R.1974; I.E.E.E. TRANS. RELIABIL.; U.S.A.; DA. 1974; VOL. 23; NO 4; PP. 231-234; BIBL. 8 REF.Article

Iterative exhaustive pattern generation for logic testingTANG, D. T; CHEN, C. L.IBM journal of research and development. 1984, Vol 28, Num 2, pp 212-219, issn 0018-8646Article

Purping: a reliability assurance technique for new technology semiconductor devicesGORDON, E. I; NASH, F. R; HARTMAN, R. L et al.IEEE electron device letters. 1983, Vol 4, Num 12, pp 465-466, issn 0741-3106Article

Origine des pannes dans les processus transitoires de technologie chimiquePOPOV, S. V; SEREBRYAKOV, B. R; BESKOV, V. S et al.Himičeskaja promyšlennost. 1983, Num 8, pp 455-457Article

Parallel Machine Scheduling under the Disruption of Machine BreakdownLIXIN TANG; YANYAN ZHANG.Industrial & engineering chemistry research. 2009, Vol 48, Num 14, pp 6660-6667, issn 0888-5885, 8 p.Article

Test point selection methods for the self-testing based analogue fault diagnosis systemWU, C. C.IEE proceedings. Part G. Electronic circuits and systems. 1985, Vol 132, Num 5, pp 173-183, issn 0143-7089Article

Segmented testingROBINSON, J. P.IEEE transactions on computers. 1985, Vol 34, Num 5, pp 467-471, issn 0018-9340Article

Essai d'utilisation des circuits de signalisation et de blocage et maintenance du fonctionnement des installations sans pannesSHABALIN, I. V; GUSYATNIKOV, A. D.Neftepererabotka i Neftehimija (Moskva). 1985, Num 9, pp 38-39, issn 0028-1190Article

Mean time to achieve a failure-free requirementANGUS, J. E; SCHAFER, R. E.IEEE transactions on reliability. 1985, Vol 34, Num 2, pp 179-183, issn 0018-9529Article

Reliability assurance for devices with a sudden-failure characteristicSAUL, R. H; CHEN, F. S.IEEE electron device letters. 1983, Vol 4, Num 12, pp 467-468, issn 0741-3106Article

A parametric solution for simple stress-strength model of failure with an applicationDARGAHI-NOUBARY, G. R.Journal of computational and applied mathematics. 1988, Vol 23, Num 2, pp 185-197, issn 0377-0427Article

An analytical interpretation of the General Equation of ReliabilityNIEUWHOF, G. W. E.Reliability engineering. 1986, Vol 14, Num 2, pp 149-161, issn 0143-8174Article

Effect of uncertain in failure rates on memory system reliabilityAMER, H. H; IYER, R. K.IEEE transactions on reliability. 1986, Vol 35, Num 4, pp 377-379, issn 0018-9529Article

Funktionssicherung in einem linienförmigen Nachrichtennetz mit Vielfachzugriff = Sécurité de fonctionnement dans un réseau de télécommunication en forme de ligne à accès multiple = Securing the function in a line shaped communication networkKAUFHOLD, B.Nachrichtentechnik. Elektronik. 1985, Vol 35, Num 8, pp 288-290, issn 0323-4657Article

Fehlerlokalisierung in analogen Schaltungen mit frequenzabhängigen Elementen = Localisation des pannes dans des circuits analogiques avec des éléments dont les caractéristiques varient avec la fréquence = The localisation of the faults in the analog circuits with elements whose characteristics vary with the frequencyWESTENDORFF, K.Nachrichtentechnik. Elektronik. 1984, Vol 34, Num 6, pp 211-212, issn 0323-4657Article

An accurate probability-of-failure calculation methodHARBITZ, A.IEEE transactions on reliability. 1983, Vol 32, Num 5, pp 458-460, issn 0018-9529Article

Online diagnostics makes manufacturing more robust. ISAMIR PADALKAR; KARSAI, G; SZTIPANOVITS, J et al.Chemical engineering (New York, NY). 1995, Vol 102, Num 3, pp 80-83, issn 0009-2460Article

Selektive Erkennung von Meβ- und Anlagenfehlern in Gasverteilungsnetzen = Selective detection of measurement and plant errors in gas distribution networksLAPPUS, G; SCHMIDT, G.Automatisierungstechnische Praxis. 1990, Vol 32, Num 9, pp 447-454, issn 0178-2320, 8 p.Article

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